Atomic Force Microscopes (AFM) (Veeco Innova)

Submitted by on Mon, 06/20/2022 - 13:19
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Field Emission Scanning Electron Microscope (FE-SEM) (Jeol 7000F)

Submitted by on Mon, 06/20/2022 - 13:17

Field Emission Scanning Electron Microscope (FE-SEM) (Jeol 7000F)

  • Energy Dispersive X-ray Analysis (EDX) (INKA, Oxford Instruments)
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Becker & Hickl GmbH

Submitted by on Mon, 06/20/2022 - 13:17

Time-correlated single photon counting (TCSPC) an amazingly sensitive technique for recording low to level light signals with picosecond resolution and extremely high precision. Includes a single photon counting module (SPC-130) (Becker & Hickl GmbH)

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Halogen, Xenon and mercury pencil lamps

Submitted by on Mon, 06/20/2022 - 13:15
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Two IR-viewers (Newport 1830C)

Submitted by on Mon, 06/20/2022 - 13:14
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