Position Description

Highly sensitive cavity-based chiral polarimetry measurements of gas, liquid, and thin-film samples.

For the full announcement, follow the link "Related Documents"

Required Qualifications

• Undergraduate degree in physics, with grade above 8/10 (30%)
• Research experience in laser spectroscopy, with CW and pulsed lasers (30%)
• Significant experience in computing, with Mathematica (20%)
• Excellent knowledge of English language (20%)

Application Procedure

Interested candidates who meet the aforementioned requirements are kindly asked to submit their applications to the address (hr@iesl.forth.gr), with cc to Prof. Peter Rakitzis (ptr@iesl.forth.gr).

In order to be considered, the application must include:

• Application Form  (Form Greek or Form English to the left)
• Brief CV
• Scanned copy of academic title
• University department certificate for enrollment in a master program

Appointment Duration