Highly sensitive cavity-based chiral polarimetry measurements of gas, liquid, and thin-film samples.
For the full announcement, follow the link "Related Documents"
Interested candidates who meet the aforementioned requirements are kindly asked to submit their applications to the address (hr@iesl.forth.gr [6]), with cc to Prof. Peter Rakitzis (ptr@iesl.forth.gr).
In order to be considered, the application must include:
Links
[1] https://www.iesl.forth.gr/people/rakitzis-peter
[2] https://www.iesl.forth.gr/sites/default/files/formgr.doc
[3] https://www.iesl.forth.gr/sites/default/files/formen.docx
[4] https://www.iesl.forth.gr/sites/default/files/positions/6%CE%A4%CE%920469%CE%97%CE%9A%CE%A5-%CE%A1%CE%9D%CE%93.pdf
[5] https://www.iesl.forth.gr/sites/default/files/positions/9%CE%A45%CE%9B469%CE%97%CE%9A%CE%A5-%CE%925%CE%9B.pdf
[6] mailto:hr@iesl.forth.gr