Publications

“Pulse Dependence of Ejection Efficiencies in the UV Ablation of Bi-Component van der Waals Solids”

A. Koubenakis, J. Labrakis, S. Georgiou

Laser printing of active optical microstructures

G. Koundourakis, C. Rockstuhl, D. Papazoglou, A. Klini, I. Zergioti, N.A. Vainos, C. Fotakis

Appl. Phys. Lett. , 78, 853, 2001, 10.1063/1.1348321

Transient and instantaneous third-order nonlinear optical response of C60 and the higher fullerenes C70, C76 and C84

E Koudoumas, M Konstantaki, A Mavromanolakis, X Michaut, S Couris, S Leach

At. Mol. Opt. Phys., 34, 4983, 2001, https://doi.org/10.1088/0953-4075/34/24/302

Holographic interferometry for the structrural diagnostics of UV laser ablation of polymer substrates

A. Bonarou, L. Antonucci, V. Tornari, S. Georgiou, C. Fotakis

Applied Physics A , 73, 5, 647-651, 2001, doi.org/10.1007/s003390101004

Few-photon quantum electrodynamics in a structured continuum

G. M. Nikolopoulos, P. Lambropoulos

J. Opt. B: Quantum Semiclass. Opt., 3, 115, 2001, doi.org/10.1088/1464-4266/3/3/308

Laser-Induced Breakdown Spectroscopy in Art and Archaeology

D. Anglos

Applied Spectroscopy , 55, 186A-205A , 2001, doi.org/10.1366/0003702011952398

Ultrafast nonlinear optical response of C60–polystyrene star polymers

E. Koudoumas, M. Konstantaki, A. Mavromanolakis, S. Courisa, Y. Ederle, C. Mathis, P. Setac, S. Leach

Chem. Phys. Lett., 335, 5-6, 533-538, 2001, https://doi.org/10.1016/S0009-2614(01)00088-4

Slice imaging: A new approach to ion imaging and velocity mapping

C.R. Gebhardt, T.P. Rakitzis, P.C. Samartzis, V. Ladopoulos, T.N. Kitsopoulos

Rev. Sci. Instrum. , 72, 10, 3848, 2001, doi.org/10.1063/1.1403010

Ultrafast electron trapping times in low-temperature-grown gallium arsenide: The effect of the arsenic precipitate spacing and size

P. A. Loukakos, C. Kalpouzos, I. E. Perakis, Z. Hatzopoulos, M. Logaki, C. Fotakis

Appl. Phys. Lett., 79, 2883, 2001, https://doi.org/10.1063/1.1413219

Modern technology in artwork conservation: a laser-based approach for process control and evaluation

V. Tornari, V. Zafiropulos, A. Bonarou, N.A. Vainos, C. Fotakis

J. Opt. and Lasers in Engineering , 34 , 309-326 , 2000, dx.doi.org/10.1016/S0143-8166(00)00068-3

Pages