We have the possibility to implement quantitative detection and mapping of chemical characteristics through spectral imaging using an XPECAM X01 Multispectral imaging system, equipped with a CMOS Monochrome sensor, covering 30 spectral bands, operating from 350 - 1200 nm, with a spatial resolution of 5M pixels. 

XPECAM X01 exploits a wide range of wavelength bands across the near ultraviolet to the infrared wavelengths of the electromagnetic spectrum, allowing the study of materials, their deterioration, and extract spectral information at selected areas from 350 nm to 1200 nm.