Optical characterization of dielectric thin films for RF MMICs
For the full announcement, follow the link "Related Documents"
Interested candidates who meet the aforementioned requirements are kindly asked to submit their applications to the address (hr@iesl.forth.gr [6]), with cc to P.I., Dr George Konstantinidis (aek@physics.uoc.gr [7]).
In order to be considered, the application must include:
Links
[1] https://www.iesl.forth.gr/people/konstantinidis-george
[2] https://www.iesl.forth.gr/sites/default/files/formgr20231024.doc
[3] https://www.iesl.forth.gr/sites/default/files/formen20231024.docx
[4] https://www.iesl.forth.gr/sites/default/files/positions/%CE%A8%CE%A9%CE%9E%CE%A1469%CE%97%CE%9A%CE%A5-%CE%A1%CE%97%CE%A4.pdf
[5] https://www.iesl.forth.gr/sites/default/files/positions/%CE%A1%CE%A9%CE%9F%CE%98469%CE%97%CE%9A%CE%A5-3%CE%9C%CE%95.pdf
[6] mailto:hr@iesl.forth.gr
[7] mailto:aek@physics.uoc.gr
[8] https://www.iesl.forth.gr/sites/default/files/formen.docx