The system aims at characterization of active components on-wafer or other prototype RF systems.
It is based on the following units:
- Anritsu MS4644B VNA
- Power control option (Performs Compression point analysis)
- Noise figure (Performs Noise figure measurmeent with proper aditional amplifiers)
- Keithley 2604B ( 2 port biasing and current measurement )
- On-wafer probe station (2 RF probes, aditional DC probes available)
- Labview control using PC
For further information or to request access please contact George Deligeorgis [1]
Undefined
