The system aims at characterization of on-wafer or other prototype RF systems.
It is based on the following units:
- HP8510c VNA
- custom made high voltage Bias-T (up to 200Volts)
- Keithley 2614B ( High voltage version )
- On-wafer probe station (2 RF probes, aditional DC probes available)
- Labview control using PC
For further information or to request access please contact George Deligeorgis [1]
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