IESL-FORTH
Published on IESL-FORTH (https://www.iesl.forth.gr)


Multi-pass Spectroscopic Ellipsometry

Undefined
Jean-Louis Stehle, P.C. Samartzis, Katerina Stamataki, Jean-Philippe Piel, George E. Katsoprinakis, Vassilis Papadakis, Xavier Schimowski, T. Peter Rakitzis and Benoit Loppinet
555
143
2014
doi.org/10.1016/j.tsf.2013.05.148
Journal
Thin Solid Films