Published on
IESL-FORTH
(
https://www.iesl.forth.gr
)
Capacitances in 4H-SiC TSI-VJFETs
Language
English
M. Kayambaki, K. Vamvoukakis, A. Stavrinidis, G. Konstantinidis, N. Kornilios, K. Zekentes
897
591 - 594
2017
doi.org/10.4028/www.scientific.net/MSF.897.591
Journal
Materials Science Forum