Part B: Imaging dielectric properties of Si nanowire oxide with conductive atomic force microscopy complemented with femtosecond laser illumination

Published on IESL-FORTH (https://www.iesl.forth.gr)

Part B: Imaging dielectric properties of Si nanowire oxide with conductive atomic force microscopy complemented with femtosecond laser illumination

Language English

E Stratakis,N Misra,E Spanakis,D Hwang,C Grigoropoulos,C Fotakis,P Tzanetakis

2008

N306

2008

https://doi.org/10.2351/1.5061419

Journal

International Congress on Applications of Lasers & Electro-Optics