Published on IESL-FORTH (https://www.iesl.forth.gr)

Imaging dielectric properties of Si nanowire oxide with conductive atomic force microscopy complemented with femtosecond laser illumination

English
Emmanuel Stratakis,Nipun Misra,Emmanuel Spanakis,David J Hwang,Costas P Grigoropoulos,Costas Fotakis,Panagiotis Tzanetakis
8
1949-1953
2008
https://doi.org/10.1021/nl0807171
Journal
Nano letters