Non-destructive depth-dependent morphological characterization of ferroelectric:semiconducting polymer blend films

Published on IESL-FORTH (https://www.iesl.forth.gr)

Non-destructive depth-dependent morphological characterization of ferroelectric:semiconducting polymer blend films

Language English

N. Spampinato, G. Pecastaings, M. Maglione, G. Hadziioannou, E. Pavlopoulou*

299

551

2021

doi.org/10.1007/s00396-020-04803-4

Journal

Colloid and Polymer Science