Published on IESL-FORTH (https://www.iesl.forth.gr)

Growth mechanism and microstructure of low defect density InN (0001) In-face thin films on Si (111) substrates

English
Th. Kehagias, G. P. Dimitrakopulos, A. O. Ajagunna, T. Koukoula, K. Tsagaraki, A. Adikimenakis, Ph. Komninou and A. Georgakilas
114
163519
2013
https://doi.org/10.1063/1.4827396
Journal
Journal of Applied Physics